Integrated circuit devices continue to shrink in size, increase in density, and improve in performance every year. Manufacturing and testing these devices while simultaneously maintaining and improving yield has become increasingly difficult. Nevertheless, Keysight Technologies' parametric test solutions continue to meet these challenges and to provide users with consistently accurate and highly automated test solutions for better process monitoring. Our award winning parametric test systems are a de facto industry standard, with over 4,000 systems installed worldwide. With a history of over 70 years of innovation and leadership in the Test and Measurement industry, Keysight knows what it takes to meet the stringent demands of parametric test customers.

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4080 Series of Parametric Test Systems
88000 HS-100 High Speed and Sensitivity Array Test SystemFlat panel displays (FPD) are everywhere, from televisions to computer monitors, notebook PCs and cellular phones. Low-temperature-poly-silicon (LTPS) technology in particular is widely adopted and well suited for mobile applications such as cellular phones, personal multimedia players (PMP) and portable navigation devices (PND).
Parametric Test SoftwareKeysight provides intuitive, flexible, powerful software solutions to simplify the measurement, collection, analysis, and management of parametric test data.
Параметрические анализаторы полупроводниковых приборов, характериографыПараметрический анализатор B1500A полностью заменяет устаревшие анализаторы Keysight 4145, 4155 и 4156 и при этом имеет ряд дополнительных аппаратных и программных возможностей, которые позволяют начинающим и опытным пользователям более эффективно определять параметры современных технологических процессов и характеристики полупроводниковых устройств.
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