Provides full thin film transistor (TFT) array testing of LTPS LCDs AM-OLEDs used in manufacturing FPDs. Proven solution for FPD manufacturers
On this page: Industry Challenges · Summary · Features and Benefits · Components · Key Specifications
Flat panel displays (FPD) are everywhere, from televisions to computer monitors, notebook PCs and cellular phones. Low-temperature-poly-silicon (LTPS) technology in particular is widely adopted and well suited for mobile applications such as cellular phones, personal multimedia players (PMP) and portable navigation devices (PND). With new consumer and commercial FPD applications emerging constantly, manufacturers are aggressively pursuing a marketplace that is growing rapidly, both in dollars and proliferation of new technologies. Meanwhile, four trends -- higher aperture ratios for brighter displays, Smaller pixels for higher resolution - VGA in cellular, reduced prices of end products and new technology adoption for higher value added panel, such as Active Matrix Organic Light-Emitting Display (AM-OLEDs), Chip-On-Glass (COG) or System-On-Glass (SOG) -- necessitate that testing quality increases while testing cost decreases.
Effective production process testing is essential because most failures occur during the Thin-Film-Transistor (TFT) array process, and dealing with overlooked failures post-process is prohibitively expensive. While FPD manufacturers understand array testing can help address these challenges, the total value of array test has not been fully realized. Feedback collected from manufacturers shows a general level of dissatisfaction with the testing sensitivity, speed and capability of currently available solutions.
High-speed and ultra-precise testing of current and new FPD technologies
The Keysight 88000 HS-100 Series (HS-101 and HS-100),together with the complete line of Keysight 88000 Series FPD Test Systems, provides FPD manufacturers with a high-quality, low-cost production test solution for all key technologies in the rapidly growing FPD market. The Keysight 88000 HS-100 Series leverages Keysight's knowledge and expertise in providing both ultra-precise measurement solutions for parametric testing and high-speed tester architectures for IC testing. Keysight Technologies has expanded its test coverage into FPD test by providing FPD manufactures with the Keysight 88000 HS-100 Series as a complement to our existing parametric test solutions.
For manufacturers of LTPS LCD and AM-OLED flat panel displays, the Keysight 88000 HS-100 Series provides both high sensitivity and short cycle time (TACT). Part of the HS-100 Series, the HS-101 is targeted especially for cost-effective COG LCD testing. The major difference between the HS-100 and HS-101 is a new external multiplexer capability available on the HS-101. Due to its broad application--fast go/no go testing for mass production, process management and a variety of other roles such as sorting, minute defect detection, reliability analysis and electrical test after LC filling/EL deposition in cell process--customers can expect to achieve post-process cost savings, expedited yield ramp-up, and stabilization of the production process.
Unlike current sample testing, the Keysight 88000 HS-100 Series offers complete product testing, which reduces manufacturing costs while improving yield. The full value of array testing is realized with the Keysight 88000 HS-100 Series. With more data for process feedback and an exact segregation of scrap parts, the Keysight 88000 HS-100 Series offers highly sensitive testing at lower cost.
The Keysight 88000 HS-100 Series -- a complete solution comprised of hardware, software and services -- is the first solution to fully realize array test value and, therefore, the most suitable and most effective solution available.
Features | Benefits |
---|---|
Highly repeatable measurement of 'absolute value' of charge | Detect more performance inconsistencies to improve the process, boost yields, and reduce scrap |
Short TACT is 3 to 10 times faster than today's tester | Testing can be accomplished quickly enough for even high-volume manufacturing of small inexpensive displays. |
Highly integrated test environment with FPD prober and probe | Safe buy and easy-to-operate (total support with prober & probe unit suppliers from quotation to post support, total performance tune-up and easy operation in multi-product production) |
Test optimization consulting | Quick start up of efficient test-by-test consulting for current and new FPD technology Customizable defect detection and fault analysis according to panel design and objective |
Primary target panel | LTPS base LCD or OLED, HTPS (High-temperature-poly-silicon) LCD |
Typical evaluation item | Pixel area: Open, Short, Ion, Ioff, Vth, OLED drive transistor Peripheral circuitry area: Open or short between lines, Shift register carry out |
Current measurement range / resolution | Range: 20 uA, 2 uA, 200nA, 20 nA / Resolution: 5 nA, 500 pA, 50 pA, 5 pA |
Charge measurement repeatability (Supplemental characteristics) | <font face="Symbol" size="2" style="-webkit-print-color-adjust: exact;">s</font> = < 5 fC (equivalent to 1 fF) [supplemental characteristics] |
Number of measurement pins | Up to 2304 pins (2 test heads with multiplexer) |
Multi site test | Up to 16 |